AFMWorkshop is an American manufacturer of high-value atomic force microscopes
for researchers, educators, and engineers.
Among the devices presented in Equipment Manufacturers Zone of Iran Nano 2011 Exhibition, mention can be made of two-dimensional gas chromatography device, sputtering deposition device and bi-functional PECVD system, scanning tunneling (STM) and atomic force microscopes
(AFM) , molecular deposition device, and the device for the production of nanopowder through Electrical Wire Explosion method.
An atomic force microscope
uses a fine needle to visualize the features of a surface with exquisite resolution and precision; it is used more often in materials science than in cellular biology.
Increasing adaptation of tools such as atomic force microscopes
means that we are reaching the stage of being able to control surface patterns and thus functionality down to the single-nanometer level, setting the stage for nanoscale circuits and devices to make their entrance.
A virus particle in the process of extrusion at the cell plasma membrane was captured with the atomic force microscope
at 15 hours after infection.
The atomic force microscope
, which offers a precise duplication of any material surface, is an advanced technique capable of developing the most accurate picture in research processes, press tv reported.
Lu quantified the smoothness achieved with each abrasive by using an atomic force microscope
to measure nanoscale features on all the samples' surfaces.
Veeco Instruments has announced the release of the Digital Instruments EnviroScope Atomic Force Microscope
System for a range of applications, including advanced material science, electrochemistry, magnetic force microscopy, and polymer and life science studies.
The features were then confirmed in measurements done by a NIST researcher, imaging with an atomic force microscope
The MultiMode PicoForce utilizes an atomic force microscope
, a scanner with closed-loop control of the z-axis that is said to accurately control tip-sample separation and new software developed specifically for force spectroscopy.
Contract notice: Turnkey Integrated Atomic Force Microscope
In addition to an optical microscope, the system has an atomic force microscope
(ATM) equipped with a specially designed probe to measure particle shapes, and a diamond compression indentor whose tip is flattened using a focused ion beam (FIB) process to the extent that the tip is 1 micron in diameter, narrow enough to compress just a single particle at a time.