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atomic force microscope
(redirected from Atomic force probe)

   Also found in: Encyclopedia, Wikipedia 0.03 sec.
atomic force microscope
A microscope that uses a tiny probe mounted on a cantilever to scan the surface of an object. The probe is extremely close tobut does not touchthe surface. As the probe traverses the surface, attractive and repulsive forces arising between it and the atoms on the surface induce forces on the probe that bend the cantilever. The amount of bending is measured and recorded, providing a map of the atoms on the surface. Atomic force microscopes can achieve magnification of a factor of 5 × 106, with a resolution of 2 angstroms, sufficient to resolve individual carbon atoms. Also called scanning force microscope.


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The NC-1 supplies both voltage and timing information, and the integrated atomic force probe enables deep sub-micron scanning and positioning.
The integral atomic force probe, in combination with a highly stable prober, such as the SUSS PM8, enables deep sub-micron scanning and positioning.
 
 
 
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