The 5-32b SIR and Electrochemical Migration
Task Group discussed the status of several ongoing projects regarding SIR testing.
ECM, or electrochemical migration
(FIGURE 1), can wreak havoc on a circuit assembly, causing everything from harmless signal glitches to complete failures.
Other analytical test methods include electrochemical migration
resistance and surface organic contamination testing, each performed in accordance with IPC standards.
and leakage currents) increasingly are the sources of diminished component reliability and service life.
0e8[ohms] of resistivity or signs of electrochemical migration
debris (FIGURE 12).
Three common failure mechanisms that tray come into play on RF high-frequency circuits are electrochemical migration
(ECM), electromigration (EM), and parasitic capacitance.
This means that the cleaning agent might not be able to clean at its full strength, possibly resulting in board failure due to contamination-induced electrochemical migration
Conductive anode filament (CAF) is a conductive copper-containing salt created by electrochemical migration
To err on the side of safety, I would suggest subjecting the product to SIR or electrochemical migration
tests when processed under the coolest anticipated SnPb profile--with an adequate safety margin--before it is introduced into production.
If partially ionized, they form hypo-halide solutions that can be very corrosive and result in electrochemical migration
and contamination-induced leakage currents.
Residues from organic chemicals can cause corrosion or lead to electrochemical migration
As the distance between conductors reduces, the risk of electrochemical migration