photoelectron

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pho·to·e·lec·tron

 (fō′tō-ĭ-lĕk′trŏn′)
n.
An electron released or ejected from a substance by the photoelectric effect.
American Heritage® Dictionary of the English Language, Fifth Edition. Copyright © 2016 by Houghton Mifflin Harcourt Publishing Company. Published by Houghton Mifflin Harcourt Publishing Company. All rights reserved.

photoelectron

(ˌfəʊtəʊɪˈlɛktrɒn)
n
(Atomic Physics) an electron ejected from an atom, molecule, or solid by an incident photon
Collins English Dictionary – Complete and Unabridged, 12th Edition 2014 © HarperCollins Publishers 1991, 1994, 1998, 2000, 2003, 2006, 2007, 2009, 2011, 2014

pho•to•e•lec•tron

(ˌfoʊ toʊ ɪˈlɛk trɒn)

n.
an electron emitted from a surface by photoemission.
[1910–15]
Random House Kernerman Webster's College Dictionary, © 2010 K Dictionaries Ltd. Copyright 2005, 1997, 1991 by Random House, Inc. All rights reserved.
ThesaurusAntonymsRelated WordsSynonymsLegend:
Noun1.photoelectron - an electron that is emitted from an atom or molecule by an incident photon
electron, negatron - an elementary particle with negative charge
Based on WordNet 3.0, Farlex clipart collection. © 2003-2012 Princeton University, Farlex Inc.
Translations

photoelectron

[ˌfəʊtəʊɪˈlektrɒn] N → fotoelectrón m
Collins Spanish Dictionary - Complete and Unabridged 8th Edition 2005 © William Collins Sons & Co. Ltd. 1971, 1988 © HarperCollins Publishers 1992, 1993, 1996, 1997, 2000, 2003, 2005
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References in periodicals archive
This structure was not resolved and hence the effect of these interactions was to broaden the spectral peaks observed in the [CO.sup.+.sub.2] photoelectron spectra.
Vibrational branching rations and asymmetry parameters in the photoionization of [CO.sup.2] in the region between 650 a 840 A
X-ray photoelectron spectroscopy (XPS) is the most commonly used technique for determining the chemical composition of surfaces.
A WEB-BASED FACILITY FOR EVALUATING PEAK-FITTING METHODS IN X-RAY PHOTOELECTRON SPECTROSCOPY
X-ray photoelectron spectroscopy (XPS) is one of the techniques that have been used to measure silicon dioxide film thicknesses.
SYSTEMATIC UNCERTAINTY IDENTIFIED IN MEASUREMENTS OF SILICON DIOXIDE FILM THICKNESSES BY X-RAY PHOTOELECTRON SPECTROSCOPY
X-ray absorption spectroscopy (XAS) uses energy-dependent modulations of photoelectron scattering to determine local atomic structure [50].
Accelerating Scientific Discovery Through Computation and Visualization
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