atomic force microscope


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Related to atomic force microscope: scanning electron microscope

atomic force microscope

n.
A microscope, capable of a magnification factor of 5 × 106 and a resolution of 2 angstroms, that provides a map of the atoms on the surface of an object by measuring the attractive and repulsive forces arising between a tiny probe drawn along the surface and the atoms on that surface. Also called scanning force microscope.
References in periodicals archive ?
Among the devices presented in Equipment Manufacturers Zone of Iran Nano 2011 Exhibition, mention can be made of two-dimensional gas chromatography device, sputtering deposition device and bi-functional PECVD system, scanning tunneling (STM) and atomic force microscopes (AFM) , molecular deposition device, and the device for the production of nanopowder through Electrical Wire Explosion method.
An atomic force microscope uses a fine needle to visualize the features of a surface with exquisite resolution and precision; it is used more often in materials science than in cellular biology.
A virus particle in the process of extrusion at the cell plasma membrane was captured with the atomic force microscope at 15 hours after infection.
Obtaining an atomic force microscope with open interfaces for the user-friendly upgrade of 3d functionality with coupled confocal raman microscope for correlative microscopy.
The atomic force microscope, which offers a precise duplication of any material surface, is an advanced technique capable of developing the most accurate picture in research processes, press tv reported.
The system employs the mechanism of the atomic force microscope (AFM) and uses a microfabricated cantilever as a cutting tool.
Lu quantified the smoothness achieved with each abrasive by using an atomic force microscope to measure nanoscale features on all the samples' surfaces.
The features were then confirmed in measurements done by a NIST researcher, imaging with an atomic force microscope in air.
The MultiMode PicoForce utilizes an atomic force microscope, a scanner with closed-loop control of the z-axis that is said to accurately control tip-sample separation and new software developed specifically for force spectroscopy.
Tenders are invited for Procurement of atomic force microscope
The A series atomic force microscope uses a very small, sharp tip to "feel," or scan over, a surface to acquire topographic information.
In addition to an optical microscope, the system has an atomic force microscope (ATM) equipped with a specially designed probe to measure particle shapes, and a diamond compression indentor whose tip is flattened using a focused ion beam (FIB) process to the extent that the tip is 1 micron in diameter, narrow enough to compress just a single particle at a time.