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device characteristic |
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The Model 4200-SCS and its associated software are widely used by semiconductor manufacturers to assure the reliability of product designs and processes by measuring critical device characteristics during development and production. Dynamic I(V) measurements like the ones taken by DIVA directly provide the correct device characteristics needed for circuit design, which provides an early indication that processed batches will produce useful devices in semiconductor manufacturing. Dynamic Generation -- determines the characteristics (display size, color, depth, memory) of the requesting wireless device and generates the image real time to maximize the image quality given these device characteristics. |
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