ion beam


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Noun1.ion beam - a beam of ions moving in the same direction at the same speed
particle beam - a collimated flow of particles (atoms or electrons or molecules)
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Targets of different materials are bombarded with deisem ion beam for basic research in nuclear physics and interdisciplinary research.
CERN, INFN and RaySearch Laboratories AB (publ) have signed a long-term license agreement allowing RaySearch to utilize the FLUKA Monte Carlo code in its research and development in the field of ion beam therapy.
The first half of the book, written by the primary authors, describes the interactions between incident ions and target atoms and introduces five ion beam analysis techniques: backscattering spectrometry, elastic recoil detection, nuclear reaction analysis, particle-induced x-ray emission, and ion channeling.
The topics include plasma and wave diagnostics, a comparison of square and near-circular multicusp waveguides, electron localization and trapping physics revisited, experimental setup for basic plasma studies, and focused ion beam experiments.
Among the deposition techniques available to developers of thin-film material, ion beam sputtering is highly valued for its ability to provide excellent layer thickness control, enhanced process stability and low optical losses.
14 May 2013 - Belgian cancer therapy company Ion Beam Applications SA (EBR:IBAB), or IBA, said today that it had signed a non-binding term sheet to sell its French drug discovery unit Cisbio Bioassays SAS to an unnamed European private equity firm for an estimated price of EUR25m (USD32.
NASDAQ: VECO) said that Ocean Thin Films, a leading precision optical coatings company, has recently qualified the SPECTOR-HT Ion Beam Deposition System for high-volume production of optical filters to be used in a broad range of applications, including biophotonics, defense, display, aerospace and lighting.
The 22 papers report on new research and applications of the technology, especially at the nanometer scale, as new facilities for precision ion beam processing come on line and more is understood about ion beam interactions with matter.
The JEM-9320 single-column focused ion beam (FIB) system provides automated, high-speed specimen preparation at nearly one-third the cost of dual beam systems.
Tokyo, Japan and Oberkochen, Germany 3/16/06 -- SII NanoTechnology, a Seiko Instruments subsidiary, and Carl Zeiss Nano Technology Systems, a division of Carl Zeiss SMT, have announced a global strategic alliance for electron and ion beam systems.
In addition to an optical microscope, the system has an atomic force microscope (ATM) equipped with a specially designed probe to measure particle shapes, and a diamond compression indentor whose tip is flattened using a focused ion beam (FIB) process to the extent that the tip is 1 micron in diameter, narrow enough to compress just a single particle at a time.
Dramatic success was recently achieved in a laboratory experiment by compressing an intense an ion beam fifty-fold.