atomic force microscope


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Related to atomic force microscope: scanning electron microscope

atomic force microscope

n.
A microscope, capable of a magnification factor of 5 × 106 and a resolution of 2 angstroms, that provides a map of the atoms on the surface of an object by measuring the attractive and repulsive forces arising between a tiny probe drawn along the surface and the atoms on that surface. Also called scanning force microscope.
American Heritage® Dictionary of the English Language, Fifth Edition. Copyright © 2016 by Houghton Mifflin Harcourt Publishing Company. Published by Houghton Mifflin Harcourt Publishing Company. All rights reserved.
References in periodicals archive ?
Moreover, manufacturing companies are increasingly opting for atomic force microscopes that enable the end users access and analyze the details of the products and the semiconductors embedded in them in a three-dimensional view.
An atomic force microscope uses a fine needle to visualize the features of a surface with exquisite resolution and precision; it is used more often in materials science than in cellular biology.
Increasing adaptation of tools such as atomic force microscopes means that we are reaching the stage of being able to control surface patterns and thus functionality down to the single-nanometer level, setting the stage for nanoscale circuits and devices to make their entrance.
A virus particle in the process of extrusion at the cell plasma membrane was captured with the atomic force microscope at 15 hours after infection.
Using an atomic force microscope, researchers at Ohio State University measured bumps on the surface of a nanomotor by dragging a tiny needle over it.
Bruker's MultiMode 8-HR Atomic Force Microscope brings extensive capabilities for nanomechanics and higher speed imaging to the company's AFM.
Among such equipment, mention can be made of scanning tunneling microscope (STM), atomic force microscope (AFM), BET, deep reactive ion etching (DRIE), HiReSPECT and capillary electrophoresis instrument.
The core element of the technology is the integration of WITec's Confocal Chromatic Sensor within the automated confocal Raman and atomic force microscope (AFM) environment of the company's large-sample alpha500, a previous R&D 100 Award winner.
The NTegra Spectra incorporates five different kinds of microscopic analysis for samples on the SPM stage: optical, Raman fluorescence, confocal, near-field scanning optical microscope and atomic force microscope (AFM) (see IBO 3/15/06).
The system employs the mechanism of the atomic force microscope (AFM) and uses a microfabricated cantilever as a cutting tool.