Auger effect

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Auger effect

(ˈaʊɡə)
n
(Atomic Physics) the spontaneous emission of an electron instead of a photon by an excited ion as a result of a vacancy being filled in an inner electron shell
[C20: named after Pierre Auger (1899–1993), French physicist]
References in periodicals archive ?
We are performing basic and applied research focusing on materials characterization using high resolution methods like Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and analytical electron microscopy (SEM and TEM) in combination with all necessary complementary techniques.
The treated surface was characterized using water contact angle measurement for surface energy, optical profilometry for surface roughness, SEM for surface features and Auger electron spectroscopy for chemical analysis of surface.
The surface of the CVD graphene was characterized by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and Raman spectroscopy.
A fee list handed out at yesterday's inauguration showed Admatel's current services ranging from simple microscopic observation costing P2,000, to auger electron spectroscopy costing P32,000.
Indeed, if both the binding energy of the photoelectron and the kinetic energy of the Auger electron are measured, a new parameter known as the Auger parameter ([alpha]') can be determined.
This article provides an overview of the Auger electron spectroscopy technique and includes examples of its use for studying coatings.
The composition of the particles was investigated by the method of EDA and Auger electron spectroscopy with ion etching.
This resource for researchers describes the application of scanning Auger electron microscopy to the surfaces of semiconducting device structures and to systems in materials science.
The results of atomic force microscopy (AFM), scanning electron microscopy (SEM), and auger electron spectroscopy (AES) analyses reveal that the [Al.
Other methods such as optical emission spectroscopy (OES), energy-dispersive x-ray spectroscopy (EDS), x-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) can also help identify solder compositions.
The company provides analytical services including EPMA, Auger electron spectroscopy surface analysis, metallography and optical microscopy.
The Microlab 350 from Thermo VG Scientific is another combined instrument, incorporating auger electron spectrometry, x-ray photoelectron spectroscopy, and reflected EELS.