Auger effect

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Auger effect

(ˈaʊɡə)
n
(Atomic Physics) the spontaneous emission of an electron instead of a photon by an excited ion as a result of a vacancy being filled in an inner electron shell
[C20: named after Pierre Auger (1899–1993), French physicist]
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References in periodicals archive ?
The chemical elements as a function of depth after maraging were analyzed by Auger Electron Spectroscopy (AES) to investigate the reasons for the coloration of the surf aces of the samples.
Auger electron spectroscopy (AES) has been widely used in the investigation of carbon bonds in carbon based materials thin films because the main peak of the carbon Auger transition involves valence states [4-13].
Auger electron spectroscopy (AES) was performed to assess segregation processes (nonhardening mechanism of radiation embrittlement) and determine the concentration of phosphorus in grain boundaries of the material.
The surface of the CVD graphene was characterized by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and Raman spectroscopy.
In addition, attempts to utilize radionuclides emitting [alpha]-ray ([sup.211]At, [sup.213]Bi) and auger electron ([sup.99m]Tc, [sup.111]In, and [sup.125]I) are also performed (Table 1) [21-25].
Auger electron spectroscopy (AES) is one of the most fundamental techniques in surface science providing chemical, growth mode, and coverage information [1, 2].
Figure 6 shows the auger electron spectroscopy (AES) results of tellurium/selenium-stacked layers before and after annealing.
A fee list handed out at yesterday's inauguration showed Admatel's current services ranging from simple microscopic observation costing P2,000, to auger electron spectroscopy costing P32,000.
Indeed, if both the binding energy of the photoelectron and the kinetic energy of the Auger electron are measured, a new parameter known as the Auger parameter ([alpha]') can be determined.
This article provides an overview of the Auger electron spectroscopy technique and includes examples of its use for studying coatings.
The composition of the particles was investigated by the method of EDA and Auger electron spectroscopy with ion etching.