ion beam

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Noun1.ion beam - a beam of ions moving in the same direction at the same speed
particle beam - a collimated flow of particles (atoms or electrons or molecules)
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Summary: Ion beam technology has garnered attention from the research field for years; as such, its applications in modern industry such as in electron device, solar cell, catalysis and nuclear security have soared
Equipped with Intevac's proprietary Ion Beam Assisted Deposition and Ion Beam Etching technologies, the VERTEX Spectra deposits decorative coatings with unique patterning effects for smartphone glass back covers.
- US-based nuclear medicine technology company NorthStar Medical Radioisotopes, LLC and IBA (Ion Beam Applications S.A., EURONEXT), a provider of proton therapy solutions for the treatment of cancer, have signed a contract with NorthStar for the purchase of as many as eight Rhodotron TT300 HE electron beam accelerators from IBA, the companies said.
[USPRwire, Wed Feb 27 2019] Looking at the current market trends as well as the promising demand status of the " Broad Ion Beam Technology Market " , it can be projected that the future years will bring out positive outcomes.
RaySearch has signed a research collaboration and licensing agreement with the National Institutes for Quantum and Radiological Science and Technology (QST), a pioneer of ion beam technology based in Chiba, Japan.
In April 2018, RayStation was selected for particle therapy jointly by clinicians and researchers at Heidelberg Ion Beam Therapy Centre (HIT) and Marburg Ion Beam Therapy Centre (MIT), Heidelberg University Hospital and the German Cancer Research Centre (DKFZ).
An alternative is the use of noncontact transportation methods: based on the Coulomb interaction [6] and the ion beam created by the electric-reactive engine [7].
The joint work with Harvard University used a focused ion beam implanter at Sandia's Ion Beam Laboratory designed for blasting single ions into precise locations on a diamond substrate.
The first half of the book, written by the primary authors, describes the interactions between incident ions and target atoms and introduces five ion beam analysis techniques: backscattering spectrometry, elastic recoil detection, nuclear reaction analysis, particle-induced x-ray emission, and ion channeling.
Hiden's Compact SIMS tool is designed for fast and easy characterization of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam. It provides isotopic sensitivity across the entire periodic table.