photoemission spectroscopy

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Related to photoemission spectroscopy: ultraviolet photoemission spectroscopy
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Last year, Zhi-Xun Shen of Stanford University and his collaborators used this technique, known as photoemission spectroscopy, to determine the binding force between paired electrons in six high-temperature superconductors, including yttrium barium copper oxide.
Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth.
Resonant spectroscopies, like Resonant Inelastic X-ray Scattering (RIXS) and angle resolved Resonant PhotoEmission Spectroscopy (RPES), offer invaluable information on the system under investigation, being able to probe different types of excitations, from electron-hole pairs (excitons), to spin-flip, to collective excitations, to orbital and magnetic excitations.
1, the collaborators determined the electronic structure of their material using Angle-Resolved Photoemission Spectroscopy (ARPES), in which x-rays striking a material surface or interface cause the photoemission of electrons at angles and kinetic energies that can be measured to obtain a detailed electronic spectrum.
Covering electron diffraction, photoemission, and alternative techniques, they look at reflection high-energy electron diffraction, inelastic scattering, ultraviolet photoemission spectroscopy, X-ray photoelectron spectroscopy, in situ spectroscopic ellipsometry, ion-beam surface characterization of thin multicomponent films, spectroscopies combined with reflection high-energy electron diffraction, deposition vapor monitoring, and real-time studies of epitaxial film growth using surface X-ray diffraction.
Many-Body Interactions in Nanoscale Materials by Angle Resolved Photoemission Spectroscopy
Most notably angle resolved photoemission spectroscopy (ARPES) and scanning tunneling microscopy (STM) will be used to study these layers.