photoemission spectroscopy

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Related to photoemission spectroscopy: ultraviolet photoemission spectroscopy
References in periodicals archive ?
Sato, "Unoccupied electronic states of 3d-transition metal phthalocyanines (MPc: M=Mn, Fe, Co, Ni, Cu and Zn) studied by inverse photoemission spectroscopy," Journal of Electron Spectroscopy and Related Phenomena, vol.
Finally, the U7A station, which is also a joint effort, utilizes x-ray photoemission spectroscopy (XPS) and near-edge x-ray absorption fine structure (NEXAFS) to study the structure and chemical nature of diverse materials from a surface and bulk perspective either in vacuum or under atmospheric reaction conditions.
Last year, Zhi-Xun Shen of Stanford University and his collaborators used this technique, known as photoemission spectroscopy, to determine the binding force between paired electrons in six high-temperature superconductors, including yttrium barium copper oxide.
02 contract notice: The school of physics and astronomy seeks tender submissions for a high repetition rate vacuum ultraviolet (vuv) laser source to be used as an excitation source for performing very high-resolution angle-resolved photoemission spectroscopy.
Wells and his students used x-ray photoemission spectroscopy (XPS) to look at the surface chemistry of one of the most commonly used chemotherapy drugs, 5-Fluorouracil (5-Fu), and the interaction between it and the type of silver coating found in medical equipment.
Pailhes et al., "Coherent d-wave superconducting gap in underdoped [La.sub.2-x]SrxCu[0.sub.4] by angle-resolved photoemission spectroscopy," Physical Review Letters, vol.
Covering electron diffraction, photoemission, and alternative techniques, they look at reflection high-energy electron diffraction, inelastic scattering, ultraviolet photoemission spectroscopy, X-ray photoelectron spectroscopy, in situ spectroscopic ellipsometry, ion-beam surface characterization of thin multicomponent films, spectroscopies combined with reflection high-energy electron diffraction, deposition vapor monitoring, and real-time studies of epitaxial film growth using surface X-ray diffraction.
Contract notice: supply of a ultraviolet photoemission spectroscopy system solved in spin and resolved at an angle
At ALS beamline 10.0.1, the collaborators determined the electronic structure of their material using Angle-Resolved Photoemission Spectroscopy (ARPES), in which x-rays striking a material surface or interface cause the photoemission of electrons at angles and kinetic energies that can be measured to obtain a detailed electronic spectrum.
Kumigashira et al., "Precise determination of band offsets and chemical states in SiN/Si studied by photoemission spectroscopy and X-ray absorption spectroscopy," Applied Physics Letters, vol.