scanning electron microscope


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Related to scanning electron microscope: Transmission electron microscope

scan·ning electron microscope

(skăn′ĭng)
n.
An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and the secondary electrons produced by it.

scanning electron microscope

n
(General Physics) a type of electron microscope that produces a three-dimensional image

scan′ning elec′tron mi`croscope


n.
a device in which electrons reflected by a specimen being examined under a moving beam are used to form a magnified, three-dimensional image on a television screen. Abbr.: SEM
[1950–55]

scan·ning electron microscope

(skăn′ĭng)
An electron microscope that moves a beam of electrons across an object and creates a three-dimensional image from both the electrons scattered by the object and the electrons knocked loose from the object.
Translations
microscopio elettronico a scansioneSEM
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References in periodicals archive ?
What is needed is a scanning electron microscope with field emitter for high-resolution imaging and local elemental chemical analysis of samples of various geometries and topography, in particular of insulating uncoated and radiation-sensitive samples or heavily tilted samples.
Another virus-induced change clearly demonstrated by using the scanning electron microscope was the proliferation of pseudopodia on the infected cells and in particular, at the edge of these cells (Figure 2A, arrows compared to Figure 1).
John Norden and Joanna Andrus put a bee into the open chamber of a scanning electron microscope.
The first practical scanning electron microscope was built in 1970 by the British-born American physicist Albert Victor Crewe.
The scanning electron microscope and electron microprobe are used to determine the composition of oxide inclusions.
Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts.
Tokyo, Japan, Apr 8, 2006 - (JCN) - The National Institute of Advanced Industrial Science and Technology (AIST) and Toyama University have jointly developed a nano-mechanical fabrication system working in a scanning electron microscope (SEM), and succeeded in real-time imaging of the nano-scale cutting process for a single crystal of silicon.
Analyses with a scanning electron microscope and a computerized-tomography scanner identified concentric ridges on the inside wails of the holes in the teeth.
A team from Hitachi High-Tech Technologies (HHT), London, UK, has unveiled their newest offering in the SEM (scanning electron microscope) market.
Implemented as electron-excited x-ray spectrometry performed in the scanning electron microscope (SEM), EPMA achieves spatial resolution both laterally and in-depth, typically at the micrometer scale in bulk specimens, and, under special circumstances, spatial resolution can be reduced to the range of nanometers.
The results of scanning electron microscope (SEM) confirmed that fines, not fiber, are the preferred sites for sizes.
a scanning electron microscope is published which enables the micro testing of materials and miniature samples at high temperature up to 1 400 o c under high vacuum and partial vacuum.

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