Features include test pattern
generation, eye pattern display, closed-caption monitoring, CIE colour chart, high dynamic range measurement, focus assist, customisable screen layout, tally interface, 4K/UHD operation, 10G IP input and 12G-SDI interfaces.
The HDG 2.0 test pattern
generator and analyzer can be powered either internally by battery or externally via an AC charger.
In this study, we propose combining regular expressions, FSM, and graph traversal techniques to construct a systematical test pattern
Usually fault simulation inspects whether all undetected faults are detected by a test pattern
. The list of the inspected faults is very large for complex circuits.
The last step is basically a process of joining the test pattern
with the test pattern
A high-level fault dictionary is generated for the given test where for each test pattern
it will be shown in which modules the defects may be detected by this pattern.
The collaboration with Belgium-based Imec (www2.imec.be) provides design-for-test (DfT) and automatic test pattern
generation technology said to ease testing of 3D-ICs with through-silicon via (TSV) functionality.
Unfortunately, errors in reading the test pattern
can occur and are particularly common in parts of the world where there is a dearth of qualified technicians.
* An application for testing and diagnostics, WinSSD, which includes bit error rate testing, throughput monitoring, loopback tests and test pattern
To gain a better understanding of how pattern voids form, a test pattern
, known as a grate pattern (Fig.
A color-bar test pattern
on the screen casts a gently moving rainbow on the wall as an elderly Englishwoman holds forth on various methods of high-speed typing, perfume, and, predominantly, the BBC Radio 4 programming--plays, the news, the shipping forecast, Women's Hour--that is her daily companion.
Before a boundary scan test pattern
can be automatically generated by a test system (see Figure 2 for the configuration of a typical boundary scan test or programming station), boundary scan devices on the board and the scan path must be characterized.