x-ray diffraction


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Related to x-ray diffraction: scanning electron microscope, Bragg's law, XRD

x-ray diffraction

n.
The scattering of x-rays by crystal atoms, producing a diffraction pattern that yields information about the structure of the crystal.

X-ray diffraction

n
(General Physics) the scattering of X-rays on contact with matter, resulting in changes in radiation intensity, which is used for studying atomic structure

x-ray diffraction


n.
diffraction of x-rays by the regularly spaced atoms of a crystal, useful for determining the arrangement of the atoms.
ThesaurusAntonymsRelated WordsSynonymsLegend:
Noun1.X-ray diffraction - the scattering of X rays by the atoms of a crystal; the diffraction pattern shows structure of the crystal
diffraction - when light passes sharp edges or goes through narrow slits the rays are deflected and produce fringes of light and dark bands
References in periodicals archive ?
LEE715C - WIT - Supply of an X-ray Diffraction Instrument
X-Ray diffraction (XRD) is a laboratory-based technique commonly used for identification of crystalline materials and analysis of unit cell dimensions.
Keywords: X-ray diffraction, intensity correction, pole figure.
CITATION: Cuccia, F., Pineault, J., Belassel, M., and Brauss, M., "Characterization of Residual Stresses on Steel Coil Springs via X-Ray Diffraction Techniques," SAE Int.
In this beginning undergraduate textbook on the principles of X-ray diffraction and its application in analyzing crystalline structures, Lee assumes no background in crystallography or optics and only an elementary knowledge of mathematics.
12 February 2016 - US-based biotechnology product development company Thermo Fisher Scientific has acquired INEL Inc., a provider of real-time X-ray diffraction systems based in Artenay, France, the company said.
"The work done by the team at Lawrence Berkeley National Lab has resulted in a great tool for monitoring X-ray diffraction experiments," says Robert Newman, CEO of MiTeGen.
The company is engaged in X-ray spectrometry, X-ray diffraction, non-destructive testing, X-ray microscopy, Raman spectroscopy and optics, as well as small molecule and protein crystallography and semiconductor metrology.
After machining the samples, residual stresses on one set of uncracked deposited tracks (S1-S3) were measured using X-ray diffraction technique, based on sin 2y method [17] which uses the planes of crystal lattice as an atomic scale "strain gauge." X-ray residual stress analysis is based on the angular shift of diffraction lines due to stresses [18].
It was found that X-ray diffraction patterns of samples of vanadium-containing gel, taken within the range from 5 to 25 minutes, are identical.
The results obtained "provide refined and in some cases new identifications of the minerals in this first X-ray diffraction analysis on Mars," a NASA researcher said.
Key words: Engineering geology, X-Ray diffraction, soil, alluvial deposits, characterization.